Multifractal characterization of random resistor and random superconductor networks
Bin Lin, Zhi-Zhong Zhang, Bambi Hu
DOI 10.1103/PhysRevA.44.960 · Physical Review A
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Abstract
We propose a generalized hierarchical model to study the multifractal properties of the random resistor and random superconductor networks. Analytical expressions for the moments of the voltage and current distributions are derived, and the critical exponents are calculated. The theoretical results are found to be in better agreement with the simulation data than previous studies.
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