Emittance compensation schemes for a superconducting rf injector
H. Vennekate, A. Arnold, P. Lu, P. Murcek, J. Teichert, R. Xiang
DOI 10.1103/PhysRevAccelBeams.21.093403 · Physical Review Accelerators and Beams
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Abstract
Contemporary particle injector technologies provide different advantages depending on the chosen design. In the case of copper rf injectors these is primarily the high accelerating field, enabling the generation of high charge bunches with very low emittance. However, the cost of that is a comparably low repetition rate. DC guns, on the other hand, can provide higher repetition rates and consequently increased beam currents at lower beam quality, i.e., increased emittance. The concept of a superconducting rf injector offers the opportunity to combine the advantages of both these concepts. However, it demands special concepts for emittance compensation, as the common approach with overlapping magnetic fields during the rf acceleration interferes with the limitations of superconductivity. The ELBE SRF Gun project is one of the most advanced in this field. Gun II, the second SRF injector at the Electron Linear accelerator with high Brilliance and low Emittance (ELBE), introduces new features for emittance compensation which were studied in detail over the last years. One of these methods is the integration of a superconducting solenoid into the cryostat. Another method uses rf focusing by retracting the photocathode’s tip from the last cell of the resonator. This paper discusses both of these schemes by briefly outlining their setups, discussing results of numerical simulations of their impact, and presenting results of initial experimental beam measurements with Gun II.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| NbTi Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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