Quantized conductance in hybrid split-gate arrays of superconducting quantum point contacts with semiconducting two-dimensional electron systems
Kaveh Delfanazari, Jiahui Li, Yusheng Xiong, Pengcheng Ma, Reuben K. Puddy, Teng Yi, Ian Farrer, Sachio Komori, Jason W.A. Robinson, Llorenc Serra, David A. Ritchie, Michael J. Kelly, Hannah J. Joyce, Charles G. Smith
DOI 10.1103/PhysRevApplied.21.014051 · Physical Review Applied
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Abstract
A quantum point contact (QPC)—a constriction in a semiconducting two-dimensional electron system with a quantized conductance—is a building block of novel spintronic and topological electronic circuits. QPCs can also be used as readout electronics, charge sensors, or switches in quantum nanocircuits. A short and impurity-free constriction with superconducting contacts is a Cooper-pair QPC analogue known as a superconducting quantum point contact (SQPC). The technological development of such quantum devices has been prolonged due to the challenges of maintaining their geometrical requirement and near-unity superconductor-semiconductor interface transparency. Here, we develop advanced nanofabrication, material and device engineering techniques and report on an innovative realization of nanoscale hybrid SQPC arrays with split gate technology in semiconducting 2D electron systems. We exploit the special gate tunability of the quantum wells, and demonstrate the first experimental observation of conductance quantization in hybrid InGaAs-Nb SQPCs. We observe reproducible quantized conductance at zero magnetic fields in multiple quantum nanodevices fabricated in a single chip and systematically investigate the quantum transport of SQPCs at low and high magnetic fields for their potential applications in quantum metrology, for extremely accurate voltage standards, and fault-tolerant quantum technologies.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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