Effect of junction critical current disorder in superconducting quantum interference filter arrays
K.-H. Müller, E. E. Mitchell
DOI 10.1103/PhysRevB.109.054507 · Physical Review B
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Abstract
In this study, we investigated the performance of two 2D superconducting quantum interference filter (SQIF) arrays fabricated from YBCO thin films at a temperature of 77 K. Each array consisted of 6 Josephson junctions (JJs) in parallel and 167 in series. We conducted both experimental and theoretical analyses, measuring the arrays' voltage responses to an applied magnetic field and their voltage versus bias-current characteristics. To properly model the planar array layouts, our theoretical model used the stream function approach and also included the Johnson noise in the JJs. The model further divides the superconducting current density of the arrays into its Meissner current, circulating current, and bias current parts for practicality. Since the fabrication process of YBCO thin films cannot produce identical JJ critical currents, we assumed a log-normal distribution to model the JJ critical current disorder. Our model predictions, with a JJ critical current spread of 50%, agreed well with our experimental data. Using our model, we were able to study the dependence of the voltage modulation depth on critical current disorder and London penetration depth. We also analyzed the observed reflection asymmetries of the voltage versus magnetic field characteristics, which might provide insight into the degree of critical current disorder. Overall, our findings suggest that the use of YBCO thin films in SQIF arrays is promising, despite the critical current disorder inherent in their fabrication process. Our study highlights the importance of theoretical modeling in understanding the performance of superconducting devices and provides insights that could inform the design of future SQIF arrays.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBCO Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 85.9 | Pressure not reported | unknown |
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