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Superconducting and normal-state properties of MoNx thin films

Y. H. Shi, B. R. Zhao, Y. Y. Zhao, L. Li, J. R. Liu

DOI 10.1103/PhysRevB.38.4488 · Physical Review B

T1

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Abstract

We report here the results of measurements of the superconducting critical temperature, the resistivity ρ(T), the valence band of the electronic density of states, and dHc2/dT‖Tc of MoNx thin films and discuss the variation of these experimental results with the concentration of nitrogen.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
MoN2.13

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3.4Pressure not reportedmidpoint
MoN1.5

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3.76Pressure not reportedmidpoint
MoN2.05

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3.84Pressure not reportedmidpoint
MoN0.61

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5.2Pressure not reportedmidpoint
MoN1.44

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3.92Pressure not reportedmidpoint
MoN

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29Pressure not reportedunknown
MoN

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14.8Pressure not reportedunknown
MoN

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

11Pressure not reportedunknown
MoN

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

12.8Pressure not reportedunknown

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