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Orientation-dependent x-ray-absorption near-edge studies of high-Tc superconductors

S. M. Heald, J. M. Tranquada, A. R. Moodenbaugh, Youwen Xu

DOI 10.1103/PhysRevB.38.761 · Physical Review B

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Abstract

Orientation-dependent x-ray-absorption near-edge measurements have been made on the Cu and Y K edges in oriented La1.85Sr0.15CuO4 and YBa2Cu3O7−x superconductors. The orientation dependence of the Cu edges is quite similar to that for other Cu2+ planar compounds, and allows a clear identification of a number of near-edge features. The results also demonstrate the strong similarity of the Cu-O planes in the two materials, and clearly establish that Cu1+ is being formed on the linear-chain sites for x=0.77.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
La1.85Sr0.15CuO4

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—Pressure not reportedunknown
YBa2Cu3O7-x

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown

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