Crystalline perfection of as-deposited high-Tc superconducting thin-film surfaces: ion channeling and x-ray photoelectron spectroscopy study
X. D. Wu, A. Inam, M. S. Hegde, T. Venkatesan, C. C. Chang, E. W. Chase, B. Wilkens, J. M. Tarascon
DOI 10.1103/PhysRevB.38.9307 · Physical Review B
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Abstract
Axial ion channeling in as-deposited high-Tc Y-Ba-Cu oxide superconducting thin films on (100) SrTiO3 and x-ray photoelectron spectroscopy (XPS) on the film surfaces were performed. The angular yield profile near the film surface for Ba and the surface peak intensity were measured using 3-MeV He ions. For channeling normal to the substrate, a minimum yield of 7%, compared to ∼2-3% for single crystals, was obtained. The results of ion channeling and XPS studies indicate that the as-deposited films have good crystallinity as well as stoichiometry to within ∼1 nm of the film surface.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 90 | Pressure not reported | zero_resistance |
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