Scaling behavior in electrical transport across grain boundaries in YBa2Cu3O7−δ superconductors
R. Gross, P. Chaudhari, M. Kawasaki, A. Gupta
DOI 10.1103/PhysRevB.42.10735 · Physical Review B
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Abstract
We have found that the product of the critical current and the resistance of a grain-boundary junction scale with the resistance of the boundary. This scaling is observed to hold for a variety of samples prepared by evaporation or laser ablation and whose critical current density varies by three orders of magnitude.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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