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X-ray-absorption fine-structure studies of superconducting Tl2CaBa2Cu2Ox thin films

D. DiMarzio, H. Wiesmann, D. H. Chen, S. M. Heald

DOI 10.1103/PhysRevB.42.294 · Physical Review B

T1

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Abstract

Superconducting Tl-Ca-Ba-Cu-O thin films have been prepared by the technique of reactive magnetron sputtering using targets of Tl, Ca-Ba, and Cu. Three films with different quality superconducting transitions were fabricated and analyzed. X-ray-absorption fine-structure measurements were performed on the Cu K edge in order to determine orientation, bond lengths, number of nearest neighbors, and relative disorder as a function of the quality of their superconducting transition. Magnetically oriented powder samples of the appropriate superconducting phase were used for comparison. X-ray-absorption near-edge results reveal increasing CuO2 plane orientation parallel to the substrate as the quality of the superconducting transition improved, consistent with x-ray-diffraction data. Extended x-ray-absorption fine-structure (EXAFS) measurements also show this trend. EXAFS gives a Cu-O(1) bond length of 1.92±0.01 Å for all three films, and all three samples exhibit an increasing Debye-Waller disorder factor consistent with the deterioration in the quality of their superconducting transitions.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Tl2CaBa2Cu2O8

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

106Pressure not reportedmidpoint
Tl2CaBa2Cu2O8

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

99Pressure not reportedmidpoint
Tl2CaBa2Cu2O8

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

80Pressure not reportedmidpoint
Tl2Ca2Ba2Cu3O10

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

125Pressure not reportedunknown

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