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Hysteretic Josephson-junction behavior and phase diffusion in Ba1−xKxBiO3 films

S. Martin, E. S. Hellman, A. Kussmaul, E. H. Hartford, Jr.

DOI 10.1103/PhysRevB.48.6626 · Physical Review B

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Abstract

In Ba1−xKxBiO3 multidomain films grown on LaAlO3 substrates we find evidence for hysteretic Josephson-junction behavior. The junctions exhibit critical currents of a few μA and a finite zero-bias resistance. The critical current and zero-bias resistance depend on temperature, and amplitude of external rf irradiation. Qualitative features of the measured I-V curves can be accounted for by a simple model based on junctions in series coupled by a shunt capacitance. Estimates of the junction parameters are obtained by quantitative comparison of the data with an extended model based on classical phase diffusion.

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FormulaReported Tc (K)Pressure (GPa)Type
Ba1-xKxBiO3

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12Pressure not reportedonset

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