Normal-state resistance fluctuations in high-Tc cuprate films
Li Liu, K. Zhang, H. M. Jaeger, D. B. Buchholz, R. P. H. Chang
DOI 10.1103/PhysRevB.49.3679 · Physical Review B
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Abstract
We have measured 1/f resistance fluctuations at room temperature in YBa2Cu3Ox films as a function of oxygen content, x. The films were single phase, c-axis oriented and grown by pulsed organometallic-beam epitaxy on LaAlO3 substrates. In contrast to the monotonic increase of the film resistance with decreasing x, the normalized noise power was found to exhibit a sharp minimum at x=6.5. We attribute this behavior to vacancy creation in the Cu-O chains and discuss a simple model based on parallel conduction paths through both chains and planes.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3Ox Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 92 | Pressure not reported | midpoint |
| YBa2Cu3O6.9 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 93 | Pressure not reported | midpoint |
| YBa2Cu3Ox Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 55 | Pressure not reported | midpoint |
| YBa2Cu3Ox Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 27 | Pressure not reported | midpoint |
| Tl2Ba2CaCu2O8 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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