Scaling of Tc in proximity-coupled superconducting/normal-metal multilayers
M. L. Wilson, J. A. Cowen
DOI 10.1103/PhysRevB.49.6228 · Physical Review B
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Abstract
The superconducting transition temperature Tc has been measured in the multilayered system Nb/CuX, where CuX represents Cu, Cu1−yMny, or Cu0.95Ge0.05. The advantage of this system is that the superconductor layer thickness, normal-metal layer thickness, normal-metal magnetic concentration, and normal-metal bulk resistivity can be independently varied. Our data show that the variation of Tc with changing superconductor-layer thickness ds exhibits scaling consistent with the equation (Tcb-Tc)/Tcb=(ds/d0)−p, where d0 is a fitting parameter and Tcb is Tc for bulk Nb. We find the exponent p to increase systematically with increasing normal-metal layer thickness, and magnetic impurity concentration, with 1≤p<2, consistent with the limiting forms of two theoretical models.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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