Nonuniversal critical exponents for the superconducting critical current in lead thin films

M. C. Hernández; M. Octavio; J. M. Aponte; C. Rojas

doi:10.1103/PhysRevB.49.674

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Nonuniversal critical exponents for the superconducting critical current in lead thin films

M. C. Hernández, M. Octavio, J. M. Aponte, C. Rojas

DOI 10.1103/PhysRevB.49.674 · Physical Review B

T1

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Abstract

We present experimental results on electrical measurements of evaporated thin lead films (inverse swiss cheese model) and ion-milled thin films (swiss cheese model) at liquid-helium temperatures near the superconductor-insulator percolation threshold. We provide evidence for the nonuniversality of the critical exponents for the critical current in two dimensions for the two systems studied, in good agreement with theoretical results.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Pb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	7.2	Pressure not reported	unknown