Precision measurement of the in-plane penetration depth λab(T) in YBa2Cu3O7−δ using grain-boundary Josephson junctions
O. M. Froehlich, H. Schulze, R. Gross, A. Beck, L. Alff
DOI 10.1103/PhysRevB.50.13894 · Physical Review B
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Abstract
We have determined the temperature dependence of the ab-plane penetration depth λab in epitaxial YBa2Cu3O7−δ films by measuring the magnetic-field dependence of the critical current of YBa2Cu3O7−δ bicrystal grain-boundary Josephson junctions. Using this dc technique the change of the penetration depth with varying temperature has been measured between 4.2 and 60 K with a resolution of 0.2 Å. We found a linear λab(T) dependence at temperatures below about 10 K. This linear dependence is consistent with lines nodes of the gap function.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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