Thermal-diffusivity measurements of an oriented superconducting-film–substrate composite using the mirage technique

P. K. Wong; P. C. W. Fung; H. L. Tam; J. Gao

doi:10.1103/PhysRevB.51.523

← Back to search

Thermal-diffusivity measurements of an oriented superconducting-film–substrate composite using the mirage technique

P. K. Wong, P. C. W. Fung, H. L. Tam, J. Gao

DOI 10.1103/PhysRevB.51.523 · Physical Review B

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

When one measures the thermal diffusivity χ of a thin film on a substrate by the mirage method, the photothermal deflection of the probe beam is caused by the heat field contributed by both the film and the substrate which are heated by the pump beam. To include the effects due to the presence of the substrate, we present a method to measure the diffusivities of both the film and substrate in one set of mirage detection. Using the off-axis magnetron sputtering process, we fabricated YBa2Cu3O7−δ thin films of suitable thickness (∼60 nm) on SrTiO3 as our sample for χ measurements along the c and b axes. Our results are consistent with published ones.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown