Effect of light irradiation on Fiske resonances and the Josephson effect in high-Tc junctions
J. Elly, M. G. Medici, A. Gilabert, F. Schmidl, P. Seidel, A. Hoffmann, Ivan K. Schuller
DOI 10.1103/PhysRevB.56.R8507 · Physical Review B
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Abstract
We have performed photoexcitation experiments in high Tc YBa2Cu3Ox grain-boundary Josephson junctions. While the Josephson critical current is substantially enhanced, the normal state resistance decreases, and the positions of the extreme in the Fraunhofer diffraction pattern remain unchanged. These measurements show that the magnetic field penetration depth is not affected by light irradiation. On the other hand, the position and intensity of Fiske steps due to electromagnetic resonances increase substantially, which implies that the ratio of the thickness barrier to the dielectric constant changes by a factor of 2.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3Ox Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 84 | Pressure not reported | unknown |
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