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Superconductivity and structure of a few-unit-cells-thick Bi-Sr-Ca-Cu-O ultrathin films

Kazuo Saito, Masatsugu Kaise

DOI 10.1103/PhysRevB.57.11786 · Physical Review B

T1

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Abstract

Bi-Sr-Ca-Cu-O ultrathin films with thicknesses below 100 Å down to 10 Å have been deposited just on the (001) MgO substrate by single target rf magnetron sputtering. By elaborately controlled multistep annealing for extremely short times, remarkably high values of the zero-resistance transition temperature, Tc,0, 106, 88, and 84 K were obtained for 70-, 40-, and 20-Å-thick ultrathin films, respectively. A 10-Å-thick ultrathin film was almost insulating. Cross-sectional high-resolution transmission electron microscopy revealed that a 40-Å-thick ultrathin film with a Tc,0 of 88 K consisted of a set of half-unit-cell layers of the (2212) and (2223) phases. A 20-Å-thick ultrathin film consisted of a half-unit-cell layer of the (2212) phase. Thus, it was confirmed that in the Bi system the minimum unit for the occurrence of superconductivity is a half-unit-cell layer of the superconducting oxide crystal. Instead of the repeated use of thermal treatment at high temperatures, ion irradiation techniques combined with annealing at relatively low temperatures was useful to modify the crystal quality and related transport properties of our ultrathin films.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Bi2Sr2CaCu2O8

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—Pressure not reportedunknown
Bi2Sr2CuO6

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown
YBa2Cu3O7

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—Pressure not reportedunknown
PrBa2Cu3O7

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown

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