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Symmetry of the free states of an electron-doped Nd2−xCexCuO4−δ superconductor determined by x-ray-absorption spectroscopy

A. Yu. Ignatov, A. A. Ivanov, A. P. Menushenkov, S. Iacobucci, P. Lagarde

DOI 10.1103/PhysRevB.57.8671 · Physical Review B

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Abstract

Polarization-dependent x-ray-absorption spectroscopy at the Cu L3 and Ce M4,5 edges has been performed on epitaxial films of Nd1.85Ce0.15CuO4−δ vs defect concentration induced by He+ ion irradiation. The Cu L3 edge exhibits an increase in the integral intensity of both the white line in E∥ab (∼15%) and the first peak in E∥c (∼20%) after superconductivity suppression. At the same time, partial filling of Ce 4f orbitals (∼16%) takes place, though the shape of Ce M4,5 edges remains the same as for the formally tetravalent Ce ion. The mechanism of superconductivity suppression in Nd1.85Ce0.15CuO4−δ under He+ ion irradiation is discussed. The Cu L3-edge measurements vs Ce doping indicate that the major part (∼70%) of the excess electrons fill Cu 3dx2−y2 states in Nd1.85Ce0.15CuO4−δ. The remaining part extends beyond the CuO2 superconducting plane forming “impurity” states that seem to be localized within a few unit cells.

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FormulaReported Tc (K)Pressure (GPa)Type
Nd1.85Ce0.15CuO4

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21Pressure not reportedonset

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