Barrier properties in YBa2Cu3O7−x grain-boundary Josephson junctions using electron-beam irradiation
F. Tafuri, B. Nadgorny, S. Shokhor, M. Gurvitch, F. Lombardi, F. Carillo, A. Di Chiara, E. Sarnelli
DOI 10.1103/PhysRevB.57.R14076 · Physical Review B
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Abstract
Electron-beam irradiation has been used to induce controllable variations in the properties of YBa2Cu3O7−x biepitaxial grain-boundary Josephson junctions. A correlation between the transport properties and the microstructure was obtained by determining the ratio of a barrier thickness to the dielectric constant of the junctions with different barriers. These results give evidence of the role of the oxygen content and the dielectric constant of the interface region in transport phenomena. The experiment also demonstrates frequency tunability in a resonant soliton oscillator.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 73 | Pressure not reported | unknown |
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