Coexistence of the hot-spot effect and flux-flow instability in high-Tc superconducting films
Z. L. Xiao, E. Y. Andrei, P. Ziemann
DOI 10.1103/PhysRevB.58.11185 · Physical Review B
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Abstract
Voltage jumps were observed in current-voltage (I−V) characteristics of YBa2Cu3O7−δ superconducting film. The measurements demonstrate that the observed voltage instability originates from two different mechanisms, depending on the temperature and the magnetic field. This is inferred from the shape of the I−V characteristics, the temperature and magnetic-field dependencies of the critical current, and the critical voltage associated to the voltage jumps. Relevant models indicate that the voltage jumps at low temperatures are due to the hot-spot effect, whereas those at temperatures near Tc are due to flux-flow instabilities.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 87.6 | Pressure not reported | zero_resistance |
| YBa2Cu3O7 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 87.6 | Pressure not reported | zero_resistance |
| Bi2Sr2CaCu2O8 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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