Crossover between fractal and nonfractal flux penetration in high-temperature superconducting thin films
R. Surdeanu, R. J. Wijngaarden, B. Dam, J. Rector, R. Griessen, C. Rossel, Z. F. Ren, J. H. Wang
DOI 10.1103/PhysRevB.58.12467 · Physical Review B
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Abstract
In this study the role of anisotropy on flux penetration in c-axis epitaxial Tl2Ba2CuO6+x and YBa2Cu3O7−x films is investigated by magneto-optics. We study thin films of Tl2Ba2CuO6+x on substrates with vicinal angles of 0° (well-oriented), 0.5°, 2.5°, and 4° and YBa2Cu3O7−x films as a function of chain-conduction-induced anisotropy. A crossover from fractal to nonfractal flux penetration is observed with increasing anisotropy. Numerical simulations of anisotropic flux motion are compared with experiment.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Tl2Ba2CuO6+x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 83 | Pressure not reported | zero_resistance |
| YBa2Cu3O7-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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