c-axis current-voltage characteristics and critical current statistics of intrinsic Josephson junctions in Bi2SrCa2Cu2O8+x single crystals

Gennady Yu. Logvenov; Mikhail V. Fistul; Paul Müller

doi:10.1103/PhysRevB.59.4524

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c-axis current-voltage characteristics and critical current statistics of intrinsic Josephson junctions in Bi2SrCa2Cu2O8+x single crystals

Gennady Yu. Logvenov, Mikhail V. Fistul, Paul Müller

DOI 10.1103/PhysRevB.59.4524 · Physical Review B

T1

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Abstract

We present an experimental and theoretical investigation of c-axis current-voltage characteristics (CVC’s) in small Bi2Sr2CaCu2O8+x single crystals. We describe our samples by a stack of intrinsic Josephson junctions in which the critical current between adjacent layers is a random function with probability distribution P(Ic). A simple resistively shunted junction model and corresponding CVC’s for each of the single junctions have been assumed. Making use of the observed CVC’s we obtain critical current statistics for different values of temperature and external magnetic field. We show that the penetration of an external magnetic field in the form of randomly distributed pancake vortices leads to a broadened probability distribution P(Ic).

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Bi2Sr2CaCu2O8+x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	75	Pressure not reported	onset