Magnetic force microscopy of layered superconductors

Mark W. Coffey

doi:10.1103/PhysRevB.61.15361

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Magnetic force microscopy of layered superconductors

Mark W. Coffey

DOI 10.1103/PhysRevB.61.15361 · Physical Review B

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Abstract

The solution of a general problem in the magnetic force microscopy (MFM) of superconducting multilayers in the Meissner state is presented. We treat an arbitrary number of layers M with constant penetration depth λj within each. The solution method is based upon a transfer matrix approach which provides semianalytic results. The technique is illustrated by numerical examples wherein the kernel function and lifting force are obtained. The ability to approximate continuous penetration depth profiles in half-space geometry by means of piecewise constant profiles is demonstrated. The utility of the piecewise constant representation for future application in the MFM inverse problem is discussed.