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Thickness dependence of the superconducting transition temperature of La2−xSrxCuO4 films

X. J. Chen, H. Q. Lin, C. D. Gong

DOI 10.1103/PhysRevB.61.9782 · Physical Review B

T1

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Abstract

A model of the strain effect on the transition temperature Tc of superconducting films is presented. Details are given for previously published results on the thickness dependence of Tc in the (001) La1.85Sr0.15CuO4 films. A key role is played by the strain resulting from lattice mismatch between the film and the substrate, which is responsible for the behavior of Tc. Calculations show that the values of Tc of the films on SrLaAlO4 substrates under compressive strain are always higher than those on SrTiO3 under tensile strain. As the thickness is reduced, the films grown on SrTiO3 substrates exhibit a rapid reduction of Tc, whereas the Tc increases on SrLaAlO4 substrates. The theoretical results are in good agreement with experiments.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
La1.85Sr0.15CuO4

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38Pressure not reportedunknown
La1.9Sr0.1CuO4

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49.1Pressure not reportedunknown
La2-xSrxCuO4

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25.8Pressure not reportedunknown
La2-xSrxCuO4

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35Pressure not reportedunknown
La2-xSrxCuO4

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28.7Pressure not reportedunknown
La1.85Sr0.15CuO4

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43.70.33 GPaunknown

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