Theory of vortex force microscopy in superconducting layers
A. de la Cruz de Oña, A. Badía-Majós
DOI 10.1103/PhysRevB.70.144512 · Physical Review B
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Abstract
The interaction between a vortex within a finite-thickness type-II superconductor and a magnetic force microscopy tip is studied. By analyzing the expression of the arising lateral force, we show that the superconducting penetration depth may be recovered from experiment, using the so-called Laplace transform inversion method. This entails a vertical displacement experiment. The consideration of lateral scanning modes has allowed us to extend the theory to the more stable Hankel transform inversion method, which eventually becomes a Fourier analysis application. For the case of vortices in two-layered superconductors, we show that magnetic particle manipulation is possible by tuning the configuration of the layers.
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