Microwave-induced fluxon bunching in weakly coupled Josephson junctions
Søren Madsen, Niels Grønbech-Jensen
DOI 10.1103/PhysRevB.71.132506 · Physical Review B
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Abstract
We consider a pair of weakly coupled long Josephson junctions and investigate the conditions under which an external microwave field may phase-lock a single shuttling fluxon in each junction, and subsequently collapse the mutually repulsive fluxons into a phase-locked bunched state. Based on the coupled sine-Gordon model and the collective coordinate perturbation approach, we develop specific conditions for the physical parameters necessary to ensure the bunching of two fluxons in different junctions. The perturbation results are verified by direct numerical simulations.
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