Characteristics of strong ferromagnetic Josephson junctions with epitaxial barriers
C. Bell, R. Loloee, G. Burnell, M. G. Blamire
DOI 10.1103/PhysRevB.71.180501 · Physical Review B
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Abstract
We present the measurement of superconductor/ferromagnetic Josephson junctions, based on an epitaxial Nb bottom electrode and epitaxial Fe20Ni80 barrier. Uniform junctions have been fabricated with a barrier thicknesses in the range 2–12nm. The maximum critical current density ∼2.4±0.2×109Am−2 was found for a device with a 3−nm-thick barrier at 4.2K, corresponding to an average characteristic voltage ICRN∼16μV. The ICRN showed a nonmonotonic behavior with Fe20Ni80 thickness. The variation of the resistance of a unit area ARN, of the junctions with barrier thickness gave a Nb/Py specific interface resistance of 6.0±0.5fΩm2 and Fe20Ni80 resistivity of 174±50nΩm, consistent with other studies in polycrystalline samples.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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