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Quantitative measurements of the thermal resistance of Andreev interferometers

Z. Jiang, V. Chandrasekhar

DOI 10.1103/PhysRevB.72.020502 · Physical Review B

T1

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Abstract

Using a local thermometry technique, we have been able to quantitatively measure the thermal resistance RT of diffusive Andreev interferometers. We find that RT is strongly enhanced from its normal-state value at low temperatures, and behaves nonlinearly as a function of the thermal current through the sample. We also find that RT oscillates as a function of magnetic flux with a fundamental period corresponding to one flux quantum Φ0=h∕2e, demonstrating the phase-coherent nature of thermal transport in these devices. The magnitude of RT is larger than predicted by recent numerical simulations.

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FormulaReported Tc (K)Pressure (GPa)Type
Al

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—Pressure not reportedunknown

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