← Back to search

Bi2Sr2CaCu2O8+δ intrinsic Josephson junctions: Surface layer characterization and control

S. P. Zhao, X. B. Zhu, Y. F. Wei, G. H. Chen, Q. S. Yang, C. T. Lin

DOI 10.1103/PhysRevB.72.184511 · Physical Review B

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

Intrinsic Josephson junctions on Bi2Sr2CaCu2O8+δ superconductors are fabricated using an in situ low-temperature cleavage technique, which allows for the fabrication of well-controlled surface CuO2 double layers of different doping levels. The low-voltage I−V characteristics and c-axis conductivity properties are discussed for both the surface junctions (D−I−D′ type) and inner junctions (D−I−D type) where D denotes a d-wave superconductor. Our results show that the experimental data can be satisfactorily described in terms of the theory taking account of the coherent process with a directional tunneling matrix element.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
Bi2Sr2CaCu2O8+δ

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

91.5Pressure not reportedmidpoint

Similar papers