Critical microwave-conductivity fluctuations across the phase diagram of superconducting La2−xSrxCuO4 thin films

Haruhisa Kitano; Takeyoshi Ohashi; Atsutaka Maeda; Ichiro Tsukada

doi:10.1103/PhysRevB.73.092504

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Critical microwave-conductivity fluctuations across the phase diagram of superconducting La2−xSrxCuO4 thin films

Haruhisa Kitano, Takeyoshi Ohashi, Atsutaka Maeda, Ichiro Tsukada

DOI 10.1103/PhysRevB.73.092504 · Physical Review B

T1

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Abstract

We report a systematic study of the dynamic microwave conductivity near Tc for La2−xSrxCuO4 (LSCO) thin films with x=0.07–0.16. The strong frequency dependence of the phase stiffness together with scaling analysis of the ac fluctuating conductivity of superconductivity provide direct evidence for the two-dimensional-XY behavior of nearly decoupled CuO2 planes in underdoped LSCO (x=0.07 and 0.12). On the other hand, the critical exponents for slightly overdoped LSCO (x=0.16) were found to agree with those for the relaxational three-dimensional-XY model, indicating that the universality class in LSCO is changed by hole doping. The implication of these results for the phase diagram of high-Tc cuprates is discussed.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
La2-xSrxCuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown