Dynamics of Josephson junctions and single-flux-quantum networks with superconductor–insulator–normal-metal junction shunts
A. B. Zorin, E. M. Tolkacheva, M. I. Khabipov, F.-I. Buchholz, J. Niemeyer
DOI 10.1103/PhysRevB.74.014508 · Physical Review B
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Abstract
Within the framework of the microscopic model of tunneling, we modeled the behavior of the Josephson junction shunted by the superconductor–insulator–normal-metal (SIN) tunnel junction. The electromagnetic impedance of the SIN junction includes both the frequency-dependent damping and reactance, which affect the circuit dynamics. We calculated the dc I−V curves and transient characteristics and show their differences to the characteristics obtained within the simpler models. The correct operation of the basic single-flux-quantum circuits, i.e., the Josephson transmission line and the toggle flip-flop, based on such SIN-shunted Josephson junctions with small damping at low frequencies, has also been modeled.
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