Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates
M. A. Navacerrada, M. L. Lucía, L. L. Sánchez-Soto, F. Sánchez-Quesada, E. Sarnelli, C. Nappi
DOI 10.1103/PhysRevB.74.024507 · Physical Review B
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Abstract
We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant ε(ω). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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