Dynamic critical behaviors in two-dimensional Josephson junction arrays with positional disorder
Jaegon Um, Beom Jun Kim, Petter Minnhagen, M. Y. Choi, Sung-Ik Lee
DOI 10.1103/PhysRevB.74.094516 · Physical Review B
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Abstract
We numerically investigate dynamic critical behaviors of two-dimensional (2D) Josephson-junction arrays with positional disorder in the scheme of the resistively shunted junction dynamics. Large-scale computation of the current-voltage characteristics reveals evidence supporting that a phase transition occurs at a nonzero critical temperature in the strong disorder regime, as well as in the weak disorder regime. The phase transition at weak disorder appears to belong to the Berezinskii-Kosterlitz-Thouless (BKT) type. In contrast, evidence for a non-BKT transition is found in the strong disorder regime. These results are consistent with the recent experiment on positionally disordered Josephson-junction arrays; in particular, the critical temperature of the non-BKT transition (ranging from 0.265 down to the minimum 0.22 in units of EJ∕kB with the Josephson coupling strength EJ), the correlation length critical exponent ν=1.2, and the dynamic critical exponent z=2.0 in the strong disorder regime agree with the existing studies of the 2D gauge-glass model.
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