Pseudogap in electron-doped superconducting Sm2−xCexCuO4−δ by interlayer magnetotransport
Tsuyoshi Kawakami, Takasada Shibauchi, Yuhki Terao, Minoru Suzuki
DOI 10.1103/PhysRevB.74.144520 · Physical Review B
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Abstract
c-axis interlayer magnetoresistivity is measured for an electron-doped (n-type) superconducting cuprate Sm2−xCexCuO4−δ with x=0.14–0.16 using 30nm thick small mesa structures. A systematic doping dependence is observed in the negative interlayer magnetoresistance (MR) component, from which the pseudogap onset temperature T* is determined as the negative MR appearance temperature. For a doping level close to the phase boundary between superconductivity and antiferromagnetism, a T* of 48K is observed. It is also found that T* decreases systematically with increasing x but is still higher than Tc. For all the doping levels, the result represents features characteristic of hole-doped (p-type) cuprates in the overdoped region, suggesting that the phase diagrams for the pseudogap are primarily similar for both the n- and p-type cuprates.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Sm2-xCexCuO4-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure unresolved | onset |
| Nd1.85Ce0.15CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| Bi2Sr2CaCu2O8+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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