Intrinsic Josephson junctions in misaligned Tl2Ba2CaCu2O8−x thin films with different tilt angles
Michael Mans, Henrik Schneidewind, Matthias Büenfeld, Frank Schmidl, Paul Seidel
DOI 10.1103/PhysRevB.74.214514 · Physical Review B
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Abstract
Tl2Ba2CaCu2O8−x films on vicinal LaAlO3 having different misorientation angles (10°, 15°, 20°, 25°) grow with their CuO2 planes tilted with respect to the substrate surface. We found intrinsic Josephson behavior in microbridges patterned out of these films for misorientation angles equal to or larger than 15°. Here we report on the fabrication process, structural, and electrical properties. Structural analyses include secondary electron microscopy images and x-ray analysis of the crystallographic structure. We also present the current voltage characteristics, which exhibit a different behavior for the 15° films than for 20° and 25° films: 15° films show enhanced critical currents, while 25° films show giant collective switching events, indicating a very small spread of critical currents. We discuss these effects with the possibility of shunts in the case of the 15° films and with the existence of collective modes in the case of the 25° films. In the latter case, we also discuss the possibility of synchronization.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Tl2Ba2CaCu2O8-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 98 | Pressure not reported | onset |
| Tl2Ba2CaCu2O8-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 103 | Pressure not reported | onset |
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