Thermal expansion of Josephson junctions as an elastic response to an effective stress field

Abstract

By introducing a concept of thermal expansion (TE) of a Josephson junction as an elastic response to an effective stress field, we studied (both analytically and numerically) the temperature and magnetic field dependences of the TE coefficient α in a single small junction and in a square array. In particular, we found that in addition to field oscillations due to Fraunhofer-type dependence of the critical current, α of a small single junction also exhibits strong flux driven temperature oscillations near TC. We also numerically simulated stress-induced response of a closed loop with finite self-inductance (a prototype of an array) and found that α of a 5×5 array may still exhibit temperature oscillations provided the applied magnetic field is strong enough to compensate for the screening-induced effects.

Source-reported materials — not catalogue approval

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