Self-ordering of random intercalates in thin films of cuprate superconductors: Growth model and x-ray diffraction diagnosis

D. Ariosa; C. Cancellieri; P. H. Lin; D. Pavuna

doi:10.1103/PhysRevB.75.184505

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Self-ordering of random intercalates in thin films of cuprate superconductors: Growth model and x-ray diffraction diagnosis

D. Ariosa, C. Cancellieri, P. H. Lin, D. Pavuna

DOI 10.1103/PhysRevB.75.184505 · Physical Review B

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Abstract

We propose a simple model for the nucleation of random intercalates during the growth of high-temperature superconductor (HTSC) films by pulsed laser deposition (PLD). The model predicts a very particular spatial distribution of defects: a Markovian-like sequence of displacements along the growth direction (c axis), as well as a two-component in-plane correlation function, characteristic of self-organized intercalates. A model for x-ray diffraction (XRD) on such structures is also developed and accounts for both c-axis and in-plane anomalies observed in XRD experiments. The method presented in this work constitutes a useful characterization tool in the optimization of deposition parameters for the growth of HTSC films.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Bi2Sr2CuO6 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown
Bi2Sr2CaCu2O8 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown