Microwave-induced phase escape in a Josephson tunnel junction
Sun Guozhu, Wang Yiwen, Cao Junyu, Chen Jian, Ji Zhengming, Kang Lin, Xu Weiwei, Yu Yang, Han Siyuan, Wu Peiheng
DOI 10.1103/PhysRevB.77.104531 · Physical Review B
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Abstract
We perform both theoretical and experimental investigations on the phase escape of a current-biased Josephson tunnel junction under microwave irradiation. The switching current distributions exhibit abundant nonlinear behaviors depending on the power and frequency of the applied microwave. We present a model to describe the behavior of the primary peak in the switching current distribution, which is confirmed by our experimental results. The obtained features can be used to characterize the damping parameter of Josephson junctions.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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