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Controlling Josephson dynamics by strong microwave fields

B. Chesca, S. E. Savel’ev, A. L. Rakhmanov, H. J. H. Smilde, H. Hilgenkamp

DOI 10.1103/PhysRevB.78.094505 · Physical Review B

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Abstract

We observe several sharp changes in the slope of the current-voltage characteristics (CVCs) of thin-film ramp-edge Josephson junctions between YBa2Cu3O7−δ and Nb when applying strong microwave fields. Such behavior indicates an intriguing Josephson dynamics associated with the switching from a parametric excitation regime induced by the magnetic field of the microwave via oscillations of the Josephson critical current to an ac-current-excitation regime triggered by the electric field of the microwave. We propose a model, which describes the observed features on the CVC in terms of microwave-induced multiple switching between running and locked solutions of sine-Gordon equation.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
YBa2Cu3O7-δ

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—Pressure not reportedunknown
Nb

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown
Bi2Sr2CaCu2O8+δ

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown

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