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Interplay between electron overheating and ac Josephson effect

A. De Cecco, K. Le Calvez, B. Sacépé, C. B. Winkelmann, H. Courtois

DOI 10.1103/PhysRevB.93.180505 · Physical Review B

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Abstract

We study the response of high-critical-current proximity Josephson junctions to a microwave excitation. Electron overheating in such devices is known to create hysteretic dc voltage-current characteristics. Here we demonstrate that it also strongly influences the ac response. The interplay of electron overheating and ac Josephson dynamics is revealed by the evolution of the Shapiro steps with the microwave drive amplitude. Extending the resistively shunted Josephson junction model by including a thermal balance for the electronic bath coupled to phonons, a strong electron overheating is obtained.

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FormulaReported Tc (K)Pressure (GPa)Type
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8.5Pressure not reportedunknown

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