Josephson radiation and shot noise of a semiconductor nanowire junction
David J. van Woerkom, Alex Proutski, Ruben J. J. van Gulik, Tamás Kriváchy, Diana Car, Sébastian R. Plissard, Erik P. A. M. Bakkers, Leo P. Kouwenhoven, Attila Geresdi
DOI 10.1103/PhysRevB.96.094508 · Physical Review B
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Abstract
We measured the Josephson radiation emitted by an InSb semiconductor nanowire junction utilizing photon-assisted quasiparticle tunneling in an ac-coupled superconducting tunnel junction. We quantify the action of the local microwave environment by evaluating the frequency dependence of the inelastic Cooper-pair tunneling of the nanowire junction and find the zero-frequency impedance Z(0)=492Ω with a cutoff frequency of f0=33.1GHz. We extract a circuit coupling efficiency of η≈0.1 and a detector quantum efficiency approaching unity in the high-frequency limit. In addition to the Josephson radiation, we identify a shot noise contribution with a Fano factor F≈1, consistently with the presence of single electron states in the nanowire channel.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| NbTiN Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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