Resonant activation through effective temperature oscillation in a Josephson tunnel junction
Cheng Pan, Xinsheng Tan, Yang Yu, Guozhu Sun, Ling Kang, Weiwei Xu, Jian Chen, Peiheng Wu
DOI 10.1103/PhysRevE.79.030104 · Physical Review E
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Abstract
We experimentally investigated the thermal escape from a metastable state in a Josephson tunnel junction subjected to an oscillating effective temperature. A minimum of the average escape time is observed at certain oscillation frequency. Our results confirm that the resonant activation can be caused not only by the oscillating barrier but also by the oscillating temperature. The linear dependence of the minimum average escape time on the resonant frequency suggests that the correlation between the oscillation and the escape process leads to the resonant escape.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| NbN/AlN/NbN Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 16 | Pressure not reported | unknown |
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