Imaging of Order Parameter Induced π Phase Shifts in Cuprate Superconductors by Low-Temperature Scanning Electron Microscopy
Christian Gürlich, Edward Goldobin, Rainer Straub, Dietmar Doenitz, Ariando, Henk-Jan H. Smilde, Hans Hilgenkamp, Reinhold Kleiner, Dieter Koelle
DOI 10.1103/PhysRevLett.103.067011 · Physical Review Letters
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Abstract
Low-temperature scanning electron microscopy (LTSEM) has been used to image the supercurrent distribution in ramp-type Josephson junctions between Nb and either the electron-doped cuprate Nd2−xCexCuO4−y or the hole-doped cuprate YBa2Cu3O7. For zigzag-shaped devices in the short junction limit the critical current is strongly suppressed at zero applied magnetic field. The LTSEM images show that this is due to the Josephson current counterflow in neighboring 0 and π facets, which is induced by the dx2−y2 order parameter in the cuprates. Thus, LTSEM provides imaging of the sign change of the superconducting order parameter, which can also be applied to other types of Josephson junctions.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nd2-xCexCuO4-y Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| YBa2Cu3O7-δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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