Lifetime and Coherence of Two-Level Defects in a Josephson Junction
Yoni Shalibo, Ya’ara Rofe, David Shwa, Felix Zeides, Matthew Neeley, John M. Martinis, Nadav Katz
DOI 10.1103/PhysRevLett.105.177001 · Physical Review Letters
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Abstract
We measure the lifetime (T1) and coherence (T2) of two-level defect states (TLSs) in the insulating barrier of a Josephson phase qubit and compare to the interaction strength between the two systems. We find for the average decay times a power-law dependence on the corresponding interaction strengths, whereas for the average coherence times we find an optimum at intermediate coupling strengths. We explain both the lifetime and the coherence results using the standard TLS model, including dipole radiation by phonons and anticorrelated dependence of the energy parameters on environmental fluctuations.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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