Decoupling a Cooper-Pair Box to Enhance the Lifetime to 0.2 ms
Z. Kim, B. Suri, V. Zaretskey, S. Novikov, K. D. Osborn, A. Mizel, F. C. Wellstood, B. S. Palmer
DOI 10.1103/PhysRevLett.106.120501 · Physical Review Letters
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Abstract
We present results on a circuit QED experiment in which a separate transmission line is used to address a quasilumped element superconducting microwave resonator which is in turn coupled to an Al/AlOx/Al Cooper-pair box charge qubit. With our device, we find a strong correlation between the lifetime of the qubit and the inverse of the coupling between the qubit and the transmission line. At the smallest coupling we measured, the lifetime of the Cooper-pair box was T1=200 μs, which represents more than a twentyfold improvement in the lifetime of the Cooper-pair box compared with previous results. These results imply that the loss tangent in the AlOx junction barrier must be less than about 4×10−8 at 4.5 GHz, about 4 orders of magnitude less than reported in larger area Al/AlOx/Al tunnel junctions.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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