Phase Diffusion in Graphene-Based Josephson Junctions

I. V. Borzenets; U. C. Coskun; S. J. Jones; G. Finkelstein

doi:10.1103/PhysRevLett.107.137005

← Back to search

Phase Diffusion in Graphene-Based Josephson Junctions

I. V. Borzenets, U. C. Coskun, S. J. Jones, G. Finkelstein

DOI 10.1103/PhysRevLett.107.137005 · Physical Review Letters

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

We report on graphene-based Josephson junctions with contacts made from lead. The high transition temperature of this superconductor allows us to observe the supercurrent branch at temperatures up to ∼2 K, at which point we can detect a small, but nonzero, resistance. We attribute this resistance to the phase diffusion mechanism, which has not been yet identified in graphene. By measuring the resistance as a function of temperature and gate voltage, we can further characterize the nature of the electromagnetic environment and dissipation in our samples.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Pb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	7.2	Pressure not reported	unknown