Single-Quasiparticle Trapping in Aluminum Nanobridge Josephson Junctions
E. M. Levenson-Falk, F. Kos, R. Vijay, L. Glazman, I. Siddiqi
DOI 10.1103/PhysRevLett.112.047002 · Physical Review Letters
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Abstract
We present microwave measurements of a high quality factor superconducting resonator incorporating two aluminum nanobridge Josephson junctions in a loop shunted by an on-chip capacitor. Trapped quasiparticles (QPs) shift the resonant frequency, allowing us to probe the trapped QP number and energy distribution and to quantify their lifetimes. We find that the trapped QP population obeys a Gibbs distribution above 75 mK, with non-Poissonian trapping statistics. Our results are in quantitative agreement with the Andreev bound state model of transport, and demonstrate a practical means to quantify on-chip QP populations and validate mitigation strategies in a cryogenic environment.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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