Microstructure, dimensionality, and depression of the transition temperature in disordered superconducting films

A. F. Hebard; A. T. Fiory

doi:10.1103/PhysRevLett.58.1131

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Microstructure, dimensionality, and depression of the transition temperature in disordered superconducting films

A. F. Hebard, A. T. Fiory

DOI 10.1103/PhysRevLett.58.1131 · Physical Review Letters

T1

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Abstract

Composite In/InOx films are reproducibly fabricated with two classes of microstructure, islanded at low oxide content and amorphous-composite at high oxide content. The islanded films, near the percolation threshold, exhibit a two-dimensional depression of the mean-field transition temperature proportional to normal-state sheet resistance. The corresponding behavior in the amorphous composite films with similar resistivities is three-dimensional with a quadratic dependence on normal-state resistivity. Consistency with respective theory for each case is discussed.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
In Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	3.4	Pressure not reported	unknown