New method to study the proximity effect at the normal-metal–superconductor interface

P. C. van Son; H. van Kempen; P. Wyder

doi:10.1103/PhysRevLett.59.2226

← Back to search

New method to study the proximity effect at the normal-metal–superconductor interface

P. C. van Son, H. van Kempen, P. Wyder

DOI 10.1103/PhysRevLett.59.2226 · Physical Review Letters

T1

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

The excess current of a point contact on a Ag-Pb bilayer has been measured for several thicknesses of the Ag film. The excess current is due to Andreev reflection and contains information about the position dependence of the superconducting order parameter near the interface. If the Ag film is very thin, the excess current is that of a normal-metal–superconductor point contact, though slightly changed because of the depression of the order parameter at the surface of the bilayer. For larger thicknesses, the combination of the proximity effect and the limited mean free path of the electrons yields very different current-voltage characteristics.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Pb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	unknown