Defects, vortices, and critical current in Josephson-junction arrays
W. Xia, P. L. Leath
DOI 10.1103/PhysRevLett.63.1428 · Physical Review Letters
Active bibliographic source — not scientific approval
Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.
Abstract
The breakdown phenomena of resistively shunted two-dimensional Josephson-junction array with a single defect driven by an external current at zero temperature are studied numerically. The nonlinear Josephson relation causes the formation of vortices at the tips of the defect at iv and thus lowers the current enhancement there. Above a higher critical current ic the vortices depin from the defect and march across the sample producing a voltage. The critical current ic is studied versus defect size. Various dynamic properties and the I-V characteristics of the array are explained in the context of the vortex motion. From the observed features the critical behavior of a randomly disordered array is predicted.
Similar papers
Thermal escape of fractional vortices in long Josephson junctions
similarity 0.91U. Kienzle et al.
Source status unknown — claims are unverified
Defect formation in long Josephson junctions
similarity 0.90Anna V. Gordeeva & Andrey L. Pankratov
Source status unknown — claims are unverified
Dynamics of two-dimensional frustrated Josephson arrays
similarity 0.90Italo F. Marino & Thomas C. Halsey
Source status unknown — claims are unverified
Abrikosov vortices in long Josephson junctions
similarity 0.90Mikhail V. Fistul & Gabriele F. Giuliani
Source status unknown — claims are unverified
Theory of fractional vortex escape in a long Josephson junction
similarity 0.90K. Vogel et al.
Source status unknown — claims are unverified
Theory of fractional vortex escape in a 0-kappa long Josephson junction
similarity 0.89K. Vogel et al. · 2008 · arXiv:0812.3587
Source status unknown — claims are unverified